컴팩트 범용 투과전자현미경 [ Compact Conventional TEM]

요약 AI 요약

최대 가속전압 120kV의 컴팩트 범용 투과 전자 현미경(TEM) 1세트를 구매하는 사업이다. 고대비 상을 얻는 대물렌즈를 사용해 저대비 시료를 관찰하는 데 쓴다.

• 고대비 대물렌즈용 폴피스(고대비 극편)
• TEM 조작을 영상으로 배우는 내비게이션 시스템
• 넓은 시야 디지털 카메라(2K×2K, 30fps)
• 고해상도 TEM 카메라(CMOS, 5,688×3,336 화소 이상, 58fps 이상)
• EDS 시스템(SDD 검출기, AZtec 소프트웨어)
• TEM 소프트웨어 프레임워크(Windows 기반 GUI)

AI에게 이 공고를 물어볼 때 · ChatGPT · Claude에 이 링크를 함께 주면 공고문과 첨부를 정리한 글을 읽고 답합니다. /ai/projects/R26BK01752741 · 베타 기간 무료

사업 내용 · 이 공고에 든 일

중심 · 컴팩트 범용 투과전자현미경 본체 및 구성품 일체 납품

물품 › 연구·실험·계측장비 › 기타 연구장비

120kV급 TEM 본체와 고대비 대물렌즈·카메라·EDS·진공계통 등 일습을 제조·납품하는 연구용 분석장비 구매로, 이화학 분석기기(성분 분리·확인)보다는 현미경·물성 관찰 계열의 기타 연구장비에 해당한다.

• 고대비 대물렌즈(폴피스)
• 광시야 디지털 카메라
• 고분해능 TEM 카메라
• EDS 시스템 및 AZtec 분석 SW
• 진공 배기 시스템(터보분자펌프·다이어프램펌프)
• LaB6 필라멘트 유닛
• 모터구동 선택영역 조리개
• 주 모니터·조작부·컴퓨터 제어시스템
• 냉각수 순환기·에어컴프레서 등 부속품
• 설치·시운전(자격 엔지니어)
• 운영 교육(설치 시 무상)
• 2년 하자보수(설치 후)
• 수출 포장·선적·검사·선적서류 제출

참가 자격 · 제한

업종제한

제한 없음

지역제한

제한 없음

공동수급

공동수급불허

입찰참가 제한

모름

실적경쟁 · PQ

모름

국제입찰

국제입찰

제출 방법

우편/상시

입찰 일정

가격

외화 예산

USD 558,000 (배정예산의 통화)

예정가격 방식

비예가

납품

품명

투과전자현미경 (4111172101)

수량

1 SET

인도조건

모름

제조물품

모름

세부품명 등록

모름

공고 정보

공고종류

변경공고 (정정공고 · 1차)

게시일

10/01(목)

공고번호

R26BK01752741-001

참조번호

-

공고기관

한국과학기술원

수요기관

한국과학기술원

계약방법

일반경쟁

낙찰방법

규격적합자중 최저가

계약유형

총액계약

예정가격 방식

비예가

추정가격

-

배정예산

-

사전규격번호

R26BD00269856

재공고

재공고

출처

나라장터

첨부파일

• PDF · 1. (재공고) 외자구매 입찰 공고_26-2D-00180_TEM_v1.pdf · 공고규격서
• PDF · 4. 1년 보증 (최종)General Provisions for Bidding and Contract.pdf · 공고규격서
• PDF · 4.영문 규격서_Compact Conventional TEM.pdf · 공고규격서
• PDF · NoticeforIntlBid_KAIST-26-2D-00180_TEM.pdf · 공고규격서

첨부 내용을 정리한 글 — 자격 · 배점 · 일정 · 발췌 ›

문서 발췌

과업·요구

I. End-user's Use 1. This system is a Transmission Electron Microscope(TEM) with the maximum accelerating voltage of 120kV and features an objective lens that captures high contrast images. 2. This system should be used a high-contrast pole-piece for an objective lens, enabling high-contrast TEM images to be observed from low to high magnifications. This feature has an advantage in the observation of low-contrast specimens in the fields of clinics, immunology, pharmaceutics, foods and polymers. 3. The TEM should be incorporate by a TEM Navigation System, enabling beginners to learn the procedure for operating the TEM while viewing easy-to-understand videos. In addition, using this system, expert operators must surely perform not only operations of new functions but also special operation procedures for tasks such as axis alignment after replacing the electron-gun filament through the side of the column.

4. The Large filed of View TEM camera, which is configured with the instrument as standard, provides a wide range of automatic functions. this instrument has a function to retain the brightness of electron beam at a constant level and this allows you to specify optimum observation conditions by merely changing magnification 5. In the high-resolution TEM camera configuration, a digital camera equipped with an optimally designed optical lens delivers high-definition images across the entire field of view. The advantages of digital technology also enable convenient features such as autofocus and image preview to be integrated directly into the operation window. 6. The TEM S/W framework, developed for an efficient operation environment, fully utilizes advanced Windows techniques. Digital-camera TEM images, Scanning Image appear in the TEM S/W GUI (graphical user interface) screens. The screens for routine operations are compactly arranged, enabling beginners to use the software easily. Ⅱ. 장비의 구성(Configurations of Goods)

1. 주장비

2. Accessories 1) Cooling water circulator 1 set 2) Air compressor 1 set III. Performance and Specification 1. Performance 1) Resolution Lattice image: 0.20nm or less Point to image: 0.38nm or less

Objective lens: 1×10 /min or less

Z direction: ±0.3mm Tilt X angle: ±80° (High tilt holder), Tilt Y angle: ±18° (Depend on the tilt holder) 2. Electron gun 1) Filament type: LaB6 Filament unit 2) Filament heating Autoignition, DC heating 3) Filament replacement Quick side entry replacement method 4) Bias: Self bias, coarse/fine adjustment 5) Axis alignment Digital electromagnetic deflection. 3. Electron Microscope Column system 1) Condenser lens ⦁ Lens System: 2-stage lens configuration ⦁ CL Aperture: Motor drive condenser lens aperture size selectable from 4 hole, minimum size: 20um ⦁ Axis alignment: Digital electromagnetic deflection system ⦁ Brightness adjustment: Automatic adjustment available 2) Specimen stage

Specimen quartet holder 3) Objective lens

4) Intermediate lens (IL) and Projector Lens (PL)

size selectable from 4 hole, minimum size: 10um ⦁ Axis alignment: Electromagnetic and mechanical deflection 4. Image detection chamber 1) Wide view digital camera: Image pixel: 2K×2k (4M pixels) Frame rate: 30fps (all pixels) Image format: 16-bit TIFF, BMP, JPEG 2) Beam stopper: Motor drive beam stopper Beam Stopper is used to block a direct spot beam of diffraction patterns. 5. Vacuum system 1) Evacuation method: Perfectly dry evacuation system. Turbo molecular pump & diaphragm pump Automatic sequence 2) Vacuum gauge: Pirani gauge & Penning gauge 3) Specimen holder exchange: Holder can be exchanged with electron beam kept on 6. Computer control system 1) Operation computer: OS: MS-Windows11 Professional 64-bit CPU clock: 2GHz or more Memory: 4GB or more HDD: 500GB or more

2) Control panels: Left and right panels are independently controlled Possible to place any place

5) Automatic maintenance and inspection: Available 6) Protection device: Safety device to counteract power and water failures available. 7) Self-diagnostic functions ⦁ Detected failures: Abnormal pneumatic pressure Diaphragm pump failure Turbo molecular pump failure Disconnection of Pirani gauge Decrease in the amount of cooling water Vacuum deterioration ⦁ Display: GUI display on a monitor 7. High resolution TEM Camera One digital camera for both viewing and high resolution observation and scanning and recording and transmission electron image. 1) Type: High sensitivity low noise CMOS camera Fine specimen detail imaging at low electron dose

8. EDS system 1) EDS detector: SDD type (LN2 free, window type) 2 Sensor size: 80mm , Active area 2) Analysis Software: AZtec Software Suite TEM Analyzer TEM Point & ID TEM Mapping AZtec Linescan AZtec Autolock AZtec AutoLayer Ⅴ. 기타 조건(Remarks) 1. Installation and Supervision Installation and Supervision will be carried out by a qualified engineer. 2. Warranty of equipment Warranty service for the goods manufactured will be provided within two year after installation. 3. Operation Training Operation training of equipment will be carried out by a qualified engineer at that time of installation free of charge. === 1. (재공고) 외자구매 입찰 공고_26-2D-00180_TEM_v1.pdf ===

외자구매 입찰 재공고

공고번호: KAIST 26-2D-00180 1. 입찰에 부치는 사항 가. 입찰건명: 컴팩트 범용 투과 전자 현미경 (COMMODITY :Compact Conventional TEM) 1세트

참가자격

나. 입찰방법 ◦ 규격 및 가격 분리 입찰 ◦ 규격입찰 후 적격자에 한하여 가격입찰 진행 ◦ 규격입찰 적격자는 유선통보 또는 e-mail 통보 다. 기 타 : 규격입찰 적격자에 한하여 가격입찰 진행 2. 입찰 참가자격 가. 「국가를 당사자로 하는 계약에 관한 법률」 시행령 제12조 및 동법 시행규칙 제14조의 규정에 의한 입찰 참가자격을 구비한 자 나. KAIST 「계약업무요령」 제16조의 참가자격을 구비한 자 3. 입찰 일정 가. 규격입찰 ◦ 입찰마감일: 2026.10.08.(목), 18:00시까지 ◦ 구비서류 - 규격입찰신청서 - 영문규격서(카탈로그 포함) 1부 - 사업자등록증 1부 - 독점공급계약서 또는 대리점계약서 사본 1부 - 공급자 증명서 1부. - 입찰이행 보증보험 증권 1부(또는 지급각서) ◦ 제출방법 등 - 제출방법 : 직접제출 또는 우편제출 - 제 출 처 : 34141 대전 유성구 대학로 291 한국과학기술원 구매팀 ※ 구비서류는 간인, 날인 및 봉인(봉투에 날인)하여 제출 ※ 우편제출은 마감일 18:00까지 도착분에 한함 나. 가격입찰 ◦ 일 시 : 2026.10.19.(월) 14:30 ※ 2026.10.19.(월), 14:00 까지 입찰등록 마감(시간엄수) ◦ 개찰장소 : 한국과학기술원 구매팀(E14, 404호)

2. Bidder Eligibility A. Those who are qualified to participate in bidding under Article 12 of the Enforcement Decree of the Act on Contracts to Which State is a Party, and Article 14 of the Enforcement Regulations of the Act B. Those who meet each of the qualification criteria specified in Article 16 of the Instructions on Contract Handling of KAIST 3. Bid Schedule A. Standard bid ◦ Deadline for bidding: October 8th, 2026, 18:00 ◦ Required documents - Bid Application 1 copy - English specification (including catalog) 1 copy - Business registration certificate 1 copy - Exclusive supply agreement or agency agreement 1 copy - Supplier’s certificate 1 copy - Bid bond or memorandum submission (overseas supplier and allowed bidder submit Form 4 Bidding Deposit Payment Memorandum.) ◦ How to submit, etc. - How to submit : In person or by mail - Where to submit : Procurement Team, KAIST, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141

과업·요구

I. End-user's Use 1. This system is a Transmission Electron Microscope(TEM) with the maximum accelerating voltage of 120kV and features an objective lens that captures high contrast images. 2. This system should be used a high-contrast pole-piece for an objective lens, enabling high-contrast TEM images to be observed from low to high magnifications. This feature has an advantage in the observation of low-contrast specimens in the fields of clinics, immunology, pharmaceutics, foods and polymers. 3. The TEM should be incorporate by a TEM Navigation System, enabling beginners to learn the procedure for operating the TEM while viewing easy-to-understand videos. In addition, using this system, expert operators must surely perform not only operations of new functions but also special operation procedures for tasks such as axis alignment after replacing the electron-gun filament through the side of the column.

4. The Large filed of View TEM camera, which is configured with the instrument as standard, provides a wide range of automatic functions. this instrument has a function to retain the brightness of electron beam at a constant level and this allows you to specify optimum observation conditions by merely changing magnification 5. In the high-resolution TEM camera configuration, a digital camera equipped with an optimally designed optical lens delivers high-definition images across the entire field of view. The advantages of digital technology also enable convenient features such as autofocus and image preview to be integrated directly into the operation window. 6. The TEM S/W framework, developed for an efficient operation environment, fully utilizes advanced Windows techniques. Digital-camera TEM images, Scanning Image appear in the TEM S/W GUI (graphical user interface) screens. The screens for routine operations are compactly arranged, enabling beginners to use the software easily. 4/6 Ⅱ. 장비의 구성(Configurations of Goods)

1. 주장비

2. Accessories 1) Cooling water circulator 1 set 2) Air compressor 1 set III. Performance and Specification 1. Performance 1) Resolution Lattice image: 0.20nm or less Point to image: 0.38nm or less

Objective lens: 1×10 /min or less

Z direction: ±0.3mm Tilt X angle: ±80° (High tilt holder), Tilt Y angle: ±18° (Depend on the tilt holder) 2. Electron gun

3) Filament replacement Quick side entry replacement method 4) Bias: Self bias, coarse/fine adjustment 5) Axis alignment Digital electromagnetic deflection. 3. Electron Microscope Column system 1) Condenser lens ⦁ Lens System: 2-stage lens configuration ⦁ CL Aperture: Motor drive condenser lens aperture size selectable from 4 hole, minimum size: 20um ⦁ Axis alignment: Digital electromagnetic deflection system ⦁ Brightness adjustment: Automatic adjustment available 2) Specimen stage

Specimen quartet holder 3) Objective lens

4) Intermediate lens (IL) and Projector Lens (PL)

size selectable from 4 hole, minimum size: 10um ⦁ Axis alignment: Electromagnetic and mechanical deflection 4. Image detection chamber 1) Wide view digital camera: Image pixel: 2K×2k (4M pixels) Frame rate: 30fps (all pixels) Image format: 16-bit TIFF, BMP, JPEG 2) Beam stopper: Motor drive beam stopper Beam Stopper is used to block a direct spot beam of diffraction patterns. 5. Vacuum system 1) Evacuation method: Perfectly dry evacuation system. Turbo molecular pump & diaphragm pump Automatic sequence 6/6

6. Computer control system 1) Operation computer: OS: MS-Windows11 Professional 64-bit CPU clock: 2GHz or more Memory: 4GB or more HDD: 500GB or more 2) Control panels: Left and right panels are independently controlled Possible to place any place

5) Automatic maintenance and inspection: Available 6) Protection device: Safety device to counteract power and water failures available. 7) Self-diagnostic functions ⦁ Detected failures: Abnormal pneumatic pressure Diaphragm pump failure Turbo molecular pump failure Disconnection of Pirani gauge Decrease in the amount of cooling water Vacuum deterioration ⦁ Display: GUI display on a monitor 7. High resolution TEM Camera One digital camera for both viewing and high resolution observation and scanning and recording and transmission electron image. 1) Type: High sensitivity low noise CMOS camera Fine specimen detail imaging at low electron dose

8. EDS system 1) EDS detector: SDD type (LN2 free, window type) 2 Sensor size: 80mm , Active area 7/6 2) Analysis Software: AZtec Software Suite TEM Analyzer TEM Point & ID TEM Mapping AZtec Linescan AZtec Autolock AZtec AutoLayer Ⅴ. 기타 조건(Remarks) 1. Installation and Supervision Installation and Supervision will be carried out by a qualified engineer. 2. Warranty of equipment Warranty service for the goods manufactured will be provided within two year after installation. 3. Operation Training Operation training of equipment will be carried out by a qualified engineer at that time of installation free of charge. 8/6